Detection of Corrosion in Thick Film Resistors by X-Ray Imaging

In this article, a non-destructive method, using 2D X-ray imaging, to investigate corrosion defects in thick film resistors stressed by two different experiments, the single gas experiment and flowers of sulphur experiment, is presented. total, 370 devices under test (DUTs) were investigated, imaging technique, which 10 imaged sequence images evaluate propagation. The observed underlying product was verified focused ion beam analysis combined with an energy dispersive spectroscopy. presented technique enables fast method for accurately identifying progression resistors. found be especially suitable supplier benchmarking purposes as well failure field returns it allows proper evaluation surface mount while keeping analyzed assembly intact.